fix: 老化等测试模式下也需要处理电芯异常情况

Signed-off-by: huhui <huhui@sharkgulf.com>

Application/app/sox/state.c

@@ -231,9 +231,6 @@ static s32 _process_unheath(void){
 		close_dfet_reson = 2;
 		unhealth = (Health_Discharger_Failt | Health_charger_Fault);
 	}
-	if (!bms_work_is_normal()){
-		return unhealth; //测试模式只关注短路保护
-	}
 	if (bms_health()->charger_over_current || bms_health()->charger_over_temp || bms_health()->charger_lower_temp ||
 				bms_health()->charger_over_voltage || bms_health()->sigle_cell_over_voltage){
 		if (_bms_state.ps_charger_mask && !_bms_state.ps_charger_in){